Photonics Engineers
Tools and Technology
Tools Include:
- Lasers (Argon-ion lasers)
- Scanning probe microscopes (Atomic force microscopes AFM)
- Interferometers (Autocorrelators)
- Bench refractometers or polarimeters (Bench refractometers)
- HEPA filtered enclosures (Biosafety cabinets)
- Fume hoods or cupboards (Chemical hoods)
- Tumblers or polishers (Chemical mechanical polishing CMP systems)
- Scanning light or spinning disk or laser scanning microscopes (Coherent anti-Stokes Raman scattering CARS microscopes)
- Fluorescent microscopes (Confocal fluorescence microscopes)
- Semiconductor process systems (Contact lithography systems)
- Cryostats
- Voltage or current meters (Current monitors)
- Fluorescent microscopes (Deconvolution fluorescence microscopes)
- Digital cameras
- Graphic recorders (Digital panel meters)
- Oscilloscopes (Digital storage oscilloscopes DSO)
- Semiconductor process systems (Electron beam lithography systems)
- Lasers (Extreme ultraviolet lasers)
- Facsimile machines (Fax machines)
- Lasers (Femtosecond lasers)
- Flowmeters (Flow meters)
- Spectrofluorimeters or fluorimeters (Fluorescence lifetime spectrometers)
- Infrared imagers (Infrared viewers)
- Interferometers
- Isolation glove boxes
- Laser beam analyzers (Laser beam profilers)
- Vibration testers (Laser Doppler vibrometers)
- Laser printers
- Lasers (Laser tweezers)
- Digital cameras (Line scan cameras)
- Electron microscopes (Microprobe stations)
- Scanning light or spinning disk or laser scanning microscopes (Near field scanning optical microscopes NSOM)
- Infrared imagers (Near infrared cameras)
- Lasers (Nitrogen lasers)
- Optical choppers
- Utility knives (Optical fiber cleavers)
- Power meters (Optical power meters)
- Interferometers (Optical spectrum analyzers)
- Reflectometers (Optical time domain reflectometers OTDR)
- Oscilloscopes
- Laboratory safety furnaces (Oxidation furnaces)
- Personal computers
- Chromatographic detectors (Photodetectors)
- Lightmeters (Photodiode array detectors)
- Frequency counters or timer or dividers (Photon counting systems)
- Semiconductor process systems (Plasma enhanced chemical vapor deposition PECVD systems)
- Polarimeters
- Power meters
- Electron microscopes (Probe test stations)
- Level generators (Pulse generators)
- Scanning light or spinning disk or laser scanning microscopes (Raman microscopes)
- Temperature cycling chambers or thermal cyclers (Rapid thermal annealers RTA)
- Semiconductor process systems (Reactive ion etchers RIE)
- Scanning electron microscopes (Scanning electron microscopes SEM)
- Semiconductor testers (Semiconductor parameter analyzers)
- Lasers (Single photon lasers)
- Spectrofluorimeters or fluorimeters (Spectrofluorimeters)
- Spectrometers
- Spectrophotometers
- Spectrometers (Spectroscopes)
- Semiconductor process systems (Spin coaters)
- Lightmeters (Streak cameras)
- Fluorescent microscopes (Total internal reflection fluorescence TIRF microscopes)
- Lasers (Tunable diode lasers)
- Lasers (Tunable dye lasers)
- Semiconductor process systems (Vacuum deposition systems)
- Interferometers (Wavelength meters)
- Arc lamps (Xenon arc lamps)
Technologies Include:
- Analytical or scientific software
- Adept Scientific GRAMS
- BPM_CAD
- Pattern recognition software
- Photon Design FIMMPROP
- Photon Design PICWave
- Spectroscopy software
- The MathWorks MATLAB
- Computer aided design CAD software
- Apollo Photonics APSS
- Optiwave OptiBPM
- Optiwave OptiFDTD
- Optiwave OptiSPICE
- Photon Design CrystalWave
- Photon Design FIMMWAVE
- Photon Design OmniSim
- Development environment software
- C
- National Instruments LabVIEW
The data sources for the information displayed here include: O*NET™. (Using onet291)
